M. Alyass M, M. Al- Taan L. The Effect of Si/SiO2 Interface on the Electrical Properties of MOS Device with Nano Layer Silicon Dioxide Grown by Induced Laser Oxidation. RSCI [Internet]. 2017 Dec. 1 [cited 2025 Sep. 10];26(2):101-12. Available from: https://edusj.uomosul.edu.iq/index.php/rsci/article/view/46554