M. Alyass, M. and M. Al- Taan, L. 2017. The Effect of Si/SiO2 Interface on the Electrical Properties of MOS Device with Nano Layer Silicon Dioxide Grown by Induced Laser Oxidation. Rafidain Journal of Science. 26, 2 (Dec. 2017), 101–112. DOI:https://doi.org/10.33899/rjs.2017.139276.